Computation for electromigration in interconnects of microelectronic devices (Q5937908): Difference between revisions

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Normal rank
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Property / OpenAlex ID: W2044150989 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q5544538 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Front tracking and two-dimensional Riemann problems / rank
 
Normal rank
Property / cites work
 
Property / cites work: A variational level set approach to multiphase motion / rank
 
Normal rank
Property / cites work
 
Property / cites work: A level set approach to a unified model for etching, deposition, and lithography. III: Redeposition, reemission, surface diffusion, and complex simulations / rank
 
Normal rank
Property / cites work
 
Property / cites work: Curvature and the evolution of fronts / rank
 
Normal rank
Property / cites work
 
Property / cites work: A level set approach to a unified model for etching, deposition, and lithography. I: Algorithms and two-dimensional simulations / rank
 
Normal rank
Property / cites work
 
Property / cites work: A level set approach to a unified model for etching, deposition, and lithography. II: Three-dimensional simulations / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q4331794 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q4247633 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q5736805 / rank
 
Normal rank
Property / cites work
 
Property / cites work: High-Order Essentially Nonoscillatory Schemes for Hamilton–Jacobi Equations / rank
 
Normal rank
Property / cites work
 
Property / cites work: Efficient implementation of essentially nonoscillatory shock-capturing schemes / rank
 
Normal rank
Property / cites work
 
Property / cites work: Efficient implementation of essentially nonoscillatory shock-capturing schemes. II / rank
 
Normal rank
Property / cites work
 
Property / cites work: The Multi-Grid Method for the Diffusion Equation with Strongly Discontinuous Coefficients / rank
 
Normal rank
Property / cites work
 
Property / cites work: Multi-Level Adaptive Solutions to Boundary-Value Problems / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q3703469 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q3975626 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Q3809173 / rank
 
Normal rank
Property / cites work
 
Property / cites work: Black box multigrid / rank
 
Normal rank
Property / cites work
 
Property / cites work: Black box multigrid for nonsymmetric problems / rank
 
Normal rank
Property / cites work
 
Property / cites work: A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid / rank
 
Normal rank
Property / cites work
 
Property / cites work: A finite element analysis of the motion and evolution of voids due to strain and electromigration induced surface diffusion / rank
 
Normal rank
Property / cites work
 
Property / cites work: A level set approach for computing solutions to incompressible two-phase flow / rank
 
Normal rank
Property / cites work
 
Property / cites work: An Efficient, Interface-Preserving Level Set Redistancing Algorithm and Its Application to Interfacial Incompressible Fluid Flow / rank
 
Normal rank
Property / cites work
 
Property / cites work: Linking anisotropic sharp and diffuse surface motion laws via gradient flows / rank
 
Normal rank
links / mardi / namelinks / mardi / name
 

Latest revision as of 18:27, 3 June 2024

scientific article; zbMATH DE number 1621197
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English
Computation for electromigration in interconnects of microelectronic devices
scientific article; zbMATH DE number 1621197

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    Computation for electromigration in interconnects of microelectronic devices (English)
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    18 July 2001
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