Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing
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Publication:5131538
DOI10.1287/OPRE.2018.1741zbMath1446.90066OpenAlexW2892917419MaRDI QIDQ5131538
Publication date: 8 November 2020
Published in: Operations Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1287/opre.2018.1741
Inference from stochastic processes and prediction (62M20) Reliability, availability, maintenance, inspection in operations research (90B25) Production models (90B30)
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Cites Work
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