Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931)

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Change-point detection of failure mechanism for electronic devices based on Arrhenius model
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    Change-point detection of failure mechanism for electronic devices based on Arrhenius model (English)
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    26 May 2020
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    accelerated life testing
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    Arrhenius model
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    change-point analysis
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    failure mechanism
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    information criterion
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    Weibull distribution
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