Modeling thermal fatigue cracking in integrated circuits by level sets and the extended finite element method (Q535756)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Modeling thermal fatigue cracking in integrated circuits by level sets and the extended finite element method |
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Modeling thermal fatigue cracking in integrated circuits by level sets and the extended finite element method |
scientific article |
Statements
Modeling thermal fatigue cracking in integrated circuits by level sets and the extended finite element method (English)
0 references
13 May 2011
0 references
