Modeling thermal fatigue cracking in integrated circuits by level sets and the extended finite element method

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Publication:535756

DOI10.1016/S0020-7225(03)00217-9zbMATH Open1211.74203MaRDI QIDQ535756FDOQ535756


Authors: M. Stolarska, D. L. Chopp Edit this on Wikidata


Publication date: 13 May 2011

Published in: International Journal of Engineering Science (Search for Journal in Brave)





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