Defect detection in periodically patterned surfaces using independent component analysis

DOI10.1016/J.PATCOG.2008.02.011MaRDI QIDQ937425zbMATH OpenOpenAlexFDO

Authors Du-Ming Tsai, Shia-Chih Lai

Publication date 15 August 2008

Published in Pattern Recognition (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.patcog.2008.02.011

zbMATH Keywords

defect detectionindependent component analysisliquid crystal displayparticle swarm optimizationpatterned surface

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

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Cites work

• A theory for multiresolution signal decomposition: the wavelet representation
• An independent component analysis-based filter design for defect detection in low-contrast surface images
• Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
• scientific article; zbMATH DE number 3967642 (Why is no real title available?)
• Independent component analysis applied to feature extraction from colour and stereo images
• Independent component analysis for texture segmentation.
• Independent component analysis, a new concept?
• NONLINEAR SIGNAL CLASSIFICATION
• One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction
• The generalized Gabor scheme of image representation in biological and machine vision

Cited in

(8)

• An independent component analysis-based filter design for defect detection in low-contrast surface images
• scientific article; zbMATH DE number 5375540 (Why is no real title available?)
• The evaluation of normalized cross correlations for defect detection
• Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
• Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques
• One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction
• Using perceptual relation of regularity and anisotropy in the texture with independent component model for defect detection
• Defect detection using feature point matching for non-repetitive patterned images

Describes a project that uses

Uses Software

• FastICA

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