Design of mixed-signal systems for testability

DOI10.1016/S0167-9260(98)00025-XMaRDI QIDQ4225368zbMATH OpenFDO

Authors Vishwani D. Agrawal

Publication date 12 January 1999

Published in Integration (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/S0167-9260(98)00025-X

zbMATH Keywords

analog test busboundary scandesign for testabilitymixed-signal systemssystem on a chiptestingVLSI

Mathematics Subject Classification ID

Computer system organization (68M99) Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35)

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(2)

• Mixed signal test — techniques, applications and demands
• A uniform approach to mixed-signal circuit test

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