A theoretical analysis of the electromigration-induced void morphological evolution under high current density (Q1695572)
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scientific article; zbMATH DE number 6835819
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| English | A theoretical analysis of the electromigration-induced void morphological evolution under high current density |
scientific article; zbMATH DE number 6835819 |
Statements
A theoretical analysis of the electromigration-induced void morphological evolution under high current density (English)
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7 February 2018
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electromigration
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analytical solution
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void evolution
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high current density
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mass diffusion
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0.8052669167518616
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0.790179967880249
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0.7765082716941833
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0.7695713043212891
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0.7648144960403442
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