Multiscale modeling of degradation and failure of interconnect lines driven by electromigration and stress gradients (Q3365866)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 5005956
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Multiscale modeling of degradation and failure of interconnect lines driven by electromigration and stress gradients |
scientific article; zbMATH DE number 5005956 |
Statements
13 February 2006
0 references
0.7959569096565247
0 references
0.7465599179267883
0 references
0.7299299240112305
0 references
0.726624071598053
0 references
