Fast test generation for m-logic combinational circuits (Q3481653)
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scientific article; zbMATH DE number 4152318
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Fast test generation for m-logic combinational circuits |
scientific article; zbMATH DE number 4152318 |
Statements
Fast test generation for m-logic combinational circuits (English)
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1989
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fast test generation algorithm
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M-difference
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m-logic combinational circuits
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0.8893157
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0.8839956
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0.87432104
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