Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits

DOI10.1109/TC.1986.1676714MaRDI QIDQ3743251zbMATH OpenFDO

Authors Chuen-Liang Chen, M. W. Du

Publication date 1986

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TC.1986.1676714

zbMATH Keywords

bin packingfault location test setslinear tree circuitmultivalued logicuniversal fault detection test sets

Mathematics Subject Classification ID

Recommendations

• scientific article; zbMATH DE number 3865159
• On Closedness and Test Complexity of Logic Circuits
• Diagnosis of Faults in Linear Tree Networks
• scientific article; zbMATH DE number 3924683
• Single fault detection tests for circuits of functional elements

Cited in

(3)

• Minimal length test vectors for multiple-fault detection
• scientific article; zbMATH DE number 3865159 (Why is no real title available?)
• Diagnosis of Faults in Linear Tree Networks

This page was built for publication: Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3743251)