On Closedness and Test Complexity of Logic Circuits

DOI10.1109/TC.1981.1675840MaRDI QIDQ3912732zbMATH OpenFDO

Authors Hideo Fujiwara

Publication date 1981

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TC.1981.1675840

zbMATH Keywords

fault diagnosislogic functionsstuck faultsuniversal test sets

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12)

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