Mode-dependent toughness and the delamination of compressed thin films

DOI10.1016/S0022-5096(00)00007-7zbMath0992.74051WikidataQ59923846 ScholiaQ59923846MaRDI QIDQ1584900

Basile Audoly

Publication date: 6 November 2000

Published in: Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/s0022-5096(00)00007-7

zbMATH Keywords

bifurcations; buckle-driven delamination; compressed thin films; blister; film/substrate interface; mode dependence

Mathematics Subject Classification ID

74E30: Composite and mixture properties

74R99: Fracture and damage

74K35: Thin films

Related Items

Self-similar folding patterns and energy scaling in compressed elastic sheets, Nonlinear analyses of wrinkles in a film bonded to a compliant substrate, Asymptotic study of the interfacial crack with friction, ON A NONLOCAL FUNCTIONAL ARISING IN THE STUDY OF THIN-FILM BLISTERING

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