On data depth and distribution-free discriminant analysis using separating surfaces

DOI10.3150/bj/1110228239zbMath1059.62064MaRDI QIDQ1767479

Probal Chaudhuri, Anil Kumar Ghosh

Publication date: 11 March 2005

Published in: Bernoulli (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3150/bj/1110228239

zbMATH Keywords

robustness; Vapnik-Chervonenkis dimension; Bayes risk; linear discriminant analysis; elliptic symmetry; misclassification rates; quadratic discriminant analysis; half-space depth; regression depth; location-shift models; generalized \(U\)-statistic; optimal Bayes classifier

Mathematics Subject Classification ID

62G20: Asymptotic properties of nonparametric inference

62H30: Classification and discrimination; cluster analysis (statistical aspects)

62G99: Nonparametric inference

Related Items

On depth measures and dual statistics. A methodology for dealing with general data, An Extended Projection Data Depth and Its Applications to Discrimination

Uses Software

• ElemStatLearn
• AS 307

Cites Work

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