On Maximum Depth and Related Classifiers
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Publication:5467697
DOI10.1111/j.1467-9469.2005.00423.xzbMath1089.62075MaRDI QIDQ5467697
Probal Chaudhuri, Anil Kumar Ghosh
Publication date: 24 May 2006
Published in: Scandinavian Journal of Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1111/j.1467-9469.2005.00423.x
62H30: Classification and discrimination; cluster analysis (statistical aspects)
62C10: Bayesian problems; characterization of Bayes procedures
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Cites Work
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- Multivariate dispersion, central regions and depth. The lift zonoid approach
- Fast and robust discriminant analysis
- Descriptive statistics for multivariate distributions
- Asymptotics for multivariate trimming
- \(M\)-estimation, convexity and quantiles
- Convergence of depth contours for multivariate datasets
- General notions of statistical depth function.
- Structural properties and convergence results for contours of sample statistical depth functions.
- Comparison between various regression depth methods and the support vector machine to approximate the minimum number of misclassifications
- Generalized quantile processes based on multivariate depth functions, with applications in nonparametric multivariate analysis.
- On depth and deep points: A calculus.
- Clustering and classification based on the L\(_{1}\) data depth
- High breakdown estimation for multiple populations with applications to discriminant analysis
- Approximation Theorems of Mathematical Statistics
- Classification via kernel product estimators
- The multivariate L 1 -median and associated data depth
- Convergence of stochastic processes
- Measuring overlap in binary regression.