Theories for design and analysis of robust H_/H_- fault detectors
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Publication:2224801
DOI10.1016/J.JFRANKLIN.2020.11.006zbMATH Open1455.93044OpenAlexW3100057811MaRDI QIDQ2224801FDOQ2224801
Authors: Yanyan Li 
Publication date: 4 February 2021
Published in: Journal of the Franklin Institute (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jfranklin.2020.11.006
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Cited In (3)
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