A comparison of methods for estimating loss-based capability index

DOI10.1080/00949650802140711MaRDI QIDQ3401366zbMATH OpenOpenAlexFDO

Authors Chien-Wei Wu, Ming-Hung Shu, Wen Lea Pearn, Feng-Tsung Cheng

Publication date 29 January 2010

Published in Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/00949650802140711

zbMATH Keywords

coverage rateperformance comparisonlower confidence boundloss-based capability index

Mathematics Subject Classification ID

Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30)

Recommendations

• Estimating process capability index \(c_{pk}\): classical approach versus Bayesian approach
• An improved approach for estimating product performance based on the capability index \(C_{pmk}\)
• Generalized confidence intervals for the process capability index \(C_{pm}\)
• Lower confidence bounds with sample size information for C_pm applied to production yield assurance
• Confidence intervals of the index \(C_{pk}\) for normally distributed quality characteristics using classical and Bayesian methods of estimation

Cites work

• scientific article; zbMATH DE number 952740 (Why is no real title available?)
• Lower confidence bounds with sample size information for C_pm applied to production yield assurance
• Note on an Approximation to the Distribution of Non-Central χ 2
• On the asymptotic distributions of some process capability indices.
• The cumulative distribution function of process capability index \(C_{pm}\)
• Variables sampling plans with PPM fraction of defectives and process loss consideration

Cited in

(5)

• A flexible sampling scheme for variables inspection with loss consideration
• Estimating process capability index \(c_{pk}\): classical approach versus Bayesian approach
• An improved approach for estimating product performance based on the capability index \(C_{pmk}\)
• Developing loss-based functional process capability indices for simple linear profile
• Process performance evaluation based on Taguchi capability index with the consideration of measurement errors

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