How Reliable is Your Capability Index?
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DOI10.2307/2347383zbMATH Open0707.62205OpenAlexW123448071MaRDI QIDQ3489252FDOQ3489252
Authors: A. F. Bissell
Publication date: 1990
Published in: Applied Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.2307/2347383
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Cited In (24)
- Advanced multi-process performance analysis chart for an entire product with joint confidence regions
- On Confidence Intervals for Process Capability Indices in a One-Way Random Model
- A process capability index with reliable confidence intervals
- Assessing process capability based on Bayesian approach with subsamples
- Estimating process capability indexes for autocorrelated data
- Production quality and yield assurance for processes with multiple independent characteristics
- Capability index-based control chart for monitoring process mean using repetitive sampling
- A bayesian-like estimator of cpk
- A robust process capability index
- Statistical analysis of process capability indices with measurement errors: The case of \(C_p\)
- Generalized confidence intervals for the process capability indices in general random effect model with balanced data
- Generalized confidence intervals for process capability indices in the one-way random model
- Comparison of process capability indices under autocorrelated data
- Power of tests for some process capability indices
- The computation of accuracy of quality parameters by means of a monte carlo simulation
- Finite sample performance of an estimator of process capability index C pm for the autocorrelated data
- The L2risk of an isotonic estimate
- Goal directed programming for determining process efficiency using data envelopment analysis
- Sample size determination for production yield estimation with multiple independent process characteristics
- The asymptotic distribution of the estimated process capability index Cpk
- The stochastic control of process capability indices. (With discussion)
- An Approximation Approach for Making Decisions in Assessing the Capability IndexCpkfrom the Subsamples
- Quality-yield measure for production processes with very low fraction defective
- The asymptotic distribution of the process capability indexCpmk
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