Estimating process capability indexes for autocorrelated data

DOI10.1080/02664769823025zbMATH Open0934.62128OpenAlexW2034433112MaRDI QIDQ4266327FDOQ4266327

Nien Fan Zhang

Publication date: 30 September 1999

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664769823025

zbMATH Keywords

autocorrelationquality controlstationary processesprocess capability indexes

Mathematics Subject Classification ID

Time series, auto-correlation, regression, etc. in statistics (GARCH) (62M10) Applications of statistics in engineering and industry; control charts (62P30)

Cites Work

• How Reliable is Your Capability Index?
• Statistical quality control for correlated samples
• On the distributions of the estimated process capability indices
• Title not available (Why is that?)
• Title not available (Why is that?)

Cited In (15)

• ESTIMATION OFC_pFOR AUTOCORRELATED DATA AND MEASUREMENT ERRORS
• Optimal skip-lot sampling plan based on the yield index for auto-correlated data
• Statistical process control for autocorrelated data on grid
• Title not available (Why is that?)
• On the estimation of serial correlation in Markov-dependent production processes
• Basic process capability indices: an expository review
• Process incapability index for autocorrelated data in the presence of measurement errors
• A note on statistical analysis of C _pk for autocorrelated data in the presence of random measurement errors
• A new sampling strategy to reduce the effect of autocorrelation on a control chart
• Developing process-yield-based acceptance sampling plans for AR(1) auto-correlated process
• Process capability analysis for serially dependent processes of Poisson counts
• Finite sample performance of an estimator of process capability index C _pm for the autocorrelated data
• Minimizing the dry content variation in the pulp drying process using Six Sigma methodology
• Inference on C _pk for autocorrelated data in the presence of random measurement errors
• Measuring one-sided process capability index for autocorrelated data in the presence of random measurement errors

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