Effects of thickness on the polarization states in epitaxial ferroelectric thin films
DOI10.1007/S00707-013-0869-3zbMATH Open1343.74016OpenAlexW2046434224MaRDI QIDQ359515FDOQ359515
Authors: Benjamin Völker, Marc Kamlah, Tong-Yi Zhang 
Publication date: 12 August 2013
Published in: Acta Mechanica (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s00707-013-0869-3
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Thermodynamics in solid mechanics (74A15) Electromagnetic effects in solid mechanics (74F15) Energy minimization in equilibrium problems in solid mechanics (74G65) Thin films (74K35)
Cites Work
Cited In (6)
- Phase diagram and dielectric behavior of Ba\(_{0.6}\)Sr\(_{0.4}\)TiO\(_{3}\) thin films grown on orthorhombic substrates
- Compatible domain arrangements and poling ability in oriented ferroelectric films
- Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films
- Effects of interface dislocations on properties of ferroelectric thin films
- Phase field simulations of low-dimensional ferroelectrics
- Minimum size of 180 degree domains in ferroelectric thin films covered by electrodes
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