scientific article; zbMATH DE number 1941112
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Publication:4408155
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- scientific article; zbMATH DE number 1941114
- On the number of tests to detect all path delay faults in combinational logic circuits
- Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits
- Test generation for path delay faults using binary decision diagrams
- Constructing a sequence detecting robustly testable path delay faults in sequential circuits
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