Micron-scale channel formation by the release and Bond-back of pre-stressed thin films: a finite element analysis

DOI10.1016/J.JMPS.2010.02.004zbMATH Open1244.74054OpenAlexW2146776983MaRDI QIDQ442005FDOQ442005

W. T. S. Huck, Patrick R. Onck, R. K. Annabattula

Publication date: 8 August 2012

Published in: Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jmps.2010.02.004

zbMATH Keywords

finite element analysisthin filmsbuckle-driven delaminationmicro/nano-fluidic channelsrelease-and-Bond-back

Mathematics Subject Classification ID

Thin films (74K35) Finite element methods applied to problems in solid mechanics (74S05) Bifurcation and buckling (74G60)

Cites Work

• Title not available (Why is that?)
• Mixed Mode Cracking in Layered Materials
• The morphology and folding patterns of buckling-driven thin-film blisters
• Beam theory models for thin film segments cohesively bonded to an elastic half space

Cited In (1)

• Microfluidic propulsion by the metachronal beating of magnetic artificial cilia: a numerical analysis

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