Failure of microelectromechanical systems subjected to impulse loads
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Publication:833902
DOI10.1016/J.IJSOLSTR.2007.08.004zbMATH Open1167.74311OpenAlexW2065602570MaRDI QIDQ833902FDOQ833902
Jason S. Kimberley, I. Chasiotis, J. Lambros
Publication date: 14 August 2009
Published in: International Journal of Solids and Structures (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2007.08.004
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Cites Work
Cited In (6)
- Predictions of strength in MEMS components with defects --- a novel experimental--theoretical approach
- Stress-driven morphological instability and catastrophic failure of microdevices.
- Dynamic delamination of patterned thin films: a numerical study
- Mechanics of energy transfer and failure of ductile microscale beams subjected to dynamic loading
- Dynamic response of electronic materials to impact loading: review
- Initial study on the drop-impact behavior of mini Hi-Fi audio products
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