A new system of skip-lot sampling plans including resampling

DOI10.1155/2014/192412zbMATH Open1328.90032OpenAlexW2091211625WikidataQ51107846 ScholiaQ51107846MaRDI QIDQ904597FDOQ904597

Authors S. Balamurali, Muhammad Aslam, Chi-Hyuck Jun

Publication date 13 January 2016

Published in The Scientific World Journal. Probability and Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1155/2014/192412

Mathematics Subject Classification ID

Sampling theory, sample surveys (62D05) Reliability, availability, maintenance, inspection in operations research (90B25)

Recommendations

• Developing of a new system of skip-lot reinspection schemes
• Optimal design of a skip-lot sampling reinspection plan with a double sampling plan as a reference plan
• Design of SkSP-R variables sampling plans
• Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan
• Optimal designing of skip-lot sampling plan of type SkSP-2 with double sampling plan as the reference plan

Cites work

• scientific article; zbMATH DE number 3901881 (Why is no real title available?)
• scientific article; zbMATH DE number 4005404 (Why is no real title available?)
• scientific article; zbMATH DE number 3802709 (Why is no real title available?)
• A Sampling Inspection Plan for Continuous Production
• Process-targeting model for a product with two dependent quality characteristics using acceptance sampling plans
• Sampling inspection for resubmitted lots
• Variable sampling inspection for resubmitted lots based on process capability index \(C_{pk}\) for normally distributed items
• Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)

Cited in

(11)

• Capability-based quick switching sampling system for lot disposition
• Design of SkSP-R variables sampling plans
• Optimal design of a skip-lot sampling reinspection plan with a double sampling plan as a reference plan
• An efficient partial sampling inspection for lot sentencing based on process yield
• Optimal designing of an SkSP-R double sampling plan
• Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives
• Optimal designing of two-level skip-lot sampling reinspection plan
• A sampling plan for one-shot systems considering destructive inspection
• Repetitive group sampling plan based on the process capability index for the lot acceptance problem
• Developing of a new system of skip-lot reinspection schemes
• Evaluation and optimal designing of a new system of skip-lot reinspection schemes

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