The following pages link to (Q3197775):
Displaying 18 items.
- An upper bound of unreliability of non-branching programs in an arbitrary complete finite basis for one-type constant faults at the outputs of computational operators (Q669532) (← links)
- The length of a single fault detection test for constant-nonpreserving element insertions (Q830998) (← links)
- A generalization of Shannon function (Q1741462) (← links)
- Lower bounds for the lengths of single tests for Boolean circuits (Q1741479) (← links)
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
- Reliability of nonbranching programs in an arbitrary complete finite basis (Q1759235) (← links)
- The length of single fault detection tests with respect to substitution of gates with inverters (Q2096004) (← links)
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases (Q2136299) (← links)
- About the reliability of circuits in the complete finite basis containing an essential linear function (Q2206975) (← links)
- About reliability of circuits with faults of type 0 at the outputs of elements in a full finite basis containing a special function (Q2281460) (← links)
- The generalized complexity of linear Boolean functions (Q2295973) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements (Q2356509) (← links)
- Estimations of the lengths of tests for logic gates in presence of many permissible faults (Q3186843) (← links)
- Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates (Q4558289) (← links)
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two (Q4973245) (← links)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits (Q5374004) (← links)
