The following pages link to (Q3731525):
Displaying 6 items.
- Lower bounds for the lengths of single tests for Boolean circuits (Q1741479) (← links)
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Estimations of the lengths of tests for logic gates in presence of many permissible faults (Q3186843) (← links)
- Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates (Q4558289) (← links)
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits (Q5374004) (← links)
