Pages that link to "Item:Q486262"
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The following pages link to Method of integral equations in the spectral domain for the analysis of plane defects of a substrate (Q486262):
Displaying 4 items.
- Analysis of plane cylindrical wafer defects by the spectral-domain integral equation method (Q259298) (← links)
- Spectral-domain integral equation method for modeling the scattering properties of a group of planar particles in the presence of a substrate (Q285110) (← links)
- Investigation of plane defects in a dielectric wafer by spectral-domain integral equation method (Q1705387) (← links)
- Mathematical model of diffraction based on integral equations in the spectral domain (Q6665022) (← links)
