The following pages link to Bayesian reliability (Q924855):
Displaying 47 items.
- Bayesian inference of the Weibull model based on interval-censored survival data (Q382668) (← links)
- A case study of reliability and performance of the electric power distribution station based on time between failures (Q474390) (← links)
- Bayesian estimation of the limiting availability in the presence of right-censored data (Q483493) (← links)
- Confidence interval procedures for system reliability and applications to competing risks models (Q746612) (← links)
- Optimal classification policy and comparisons for highly reliable products (Q904302) (← links)
- Bayesian inference of Weibull distribution based on left truncated and right censored data (Q1659179) (← links)
- Filtering and tracking survival propensity (reconsidering the foundations of reliability) (Q1790365) (← links)
- Optimal constant-stress accelerated degradation test plans using nonlinear generalized Wiener process (Q1793777) (← links)
- Seasonal warranty prediction based on recurrent event data (Q2194479) (← links)
- On the discrete quasi xgamma distribution (Q2195956) (← links)
- Variable-sampling plans based on lifetime-performance index under exponential distribution with censoring and its extensions (Q2295125) (← links)
- Likelihood testing with censored and missing duration data (Q2320930) (← links)
- Optimal sequential Bayesian analysis for degradation tests (Q2398459) (← links)
- The imprecise Dirichlet model for multilevel system reliability (Q2431671) (← links)
- Bayesian estimation of a competing risk model based on Weibull and exponential distributions under right censored data (Q2671522) (← links)
- Improved confidence intervals for the exponential mean via tail functions (Q2807702) (← links)
- Age Replacement Policy with a Safety Constraint via the Bayesian Method (Q2892618) (← links)
- Bayesian reliability models of Weibull systems: State of the art (Q2934499) (← links)
- Centralized Bayesian reliability modelling with sensor networks (Q2935061) (← links)
- An age replacement policy via the Bayesian method (Q3082690) (← links)
- BATHTUB HAZARD RATE DISTRIBUTIONS AND FUZZY LIFE TIMES (Q4553374) (← links)
- Bayesian estimation of reliability using time-to-failure distribution of parametric degradation models (Q4960639) (← links)
- Qualitative analysis in the reliability assessment of the steam turbine plant (Q5003052) (← links)
- A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions (Q5051085) (← links)
- A consistent bayesian bootstrap for chi-squared goodness-of-fit test using a dirichlet prior (Q5078485) (← links)
- A Bayesian approach to factor screening in life tests (Q5079899) (← links)
- Degradation data analysis for samples under unequal operating conditions: a case study on train wheels (Q5127133) (← links)
- Failure probability estimation under additional subsystem information with application to semiconductor burn-in (Q5138591) (← links)
- Inference for the log-logistic distribution based on an adaptive progressive type-II censoring scheme (Q5203818) (← links)
- Reliability assessment of slot-parachute inflation based on Bayes theory (Q5219976) (← links)
- Goodness-of-fit tests based on the distance between the Dirichlet process and its base measure (Q5419469) (← links)
- Reliability assessment for products with two performance characteristics based on marginal stochastic processes and copulas (Q5867415) (← links)
- Hidden Dangers of Specifying Noninformative Priors (Q5876894) (← links)
- Step-stress accelerated degradation test planning based on Wiener process with correlation (Q5879956) (← links)
- Inferential study of single unit repairable system (Q6102656) (← links)
- Novel Nonprobabilistic Bayesian Uncertainty Quantification Method for Structures with Interval Parameters (Q6173062) (← links)
- Optimal test planning for heterogeneous Wiener processes (Q6537202) (← links)
- Failure probability estimation with differently sized reference products for semiconductor burn-in studies (Q6574671) (← links)
- Stochastic modelling and analysis of degradation for highly reliable products (Q6574676) (← links)
- Specifying prior distributions in reliability applications (Q6581556) (← links)
- Discussion of: ``Specifying prior distribution in reliability applications'' by Tian, Lewis-Beck, Niemi, and Meeker (Q6581572) (← links)
- Rejoinder to: ``Specifying prior distribution in reliability applications'' (Q6581577) (← links)
- Analyzing Markov chain Monte Carlo output (Q6601094) (← links)
- Maximum entropy based testing for fuzzy exponential random variable and its applications (Q6623476) (← links)
- A Proportional Intensity Model with Frailty for Missing Recurrent Failure Data (Q6631204) (← links)
- Assurance for Sample Size Determination in Reliability Demonstration Testing (Q6631913) (← links)
- Student-<i>t</i>Processes for Degradation Analysis (Q6636543) (← links)
