The Statistical Energy-Frequency Spectrum of Random Disturbances
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(5)- The transition from generation-recombination noise in bulk semiconductors to discrete switching in small-area semiconductors
- Estimation of the lowest limit of \(1/f\) noise in semiconductor materials
- 1/f noise under drift and thermal agitation in semiconductor materials
- Random walk and 1/f noise
- An alternative form of Hooge's relation for 1/f noise in semiconductor materials
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