On a generalization of test ideals

DOI10.1017/S0027763000008904zbMath1094.13004arXivmath/0210131MaRDI QIDQ4652216

Shunsuke Takagi, Nobuo Hara

Publication date: 24 February 2005

Published in: Nagoya Mathematical Journal (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/math/0210131

Mathematics Subject Classification ID

13A35: Characteristic (p) methods (Frobenius endomorphism) and reduction to characteristic (p); tight closure

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Cites Work

• Adjoints of ideals in regular local rings (with an appendix by Steven Dale Cutkosky)
• Coefficient ideals and the Cohen-Macaulay property of Rees algebras
• On the commutation of the test ideal with localization and completion
• Some results on test elements
• F-regular and F-pure rings vs. log terminal and log canonical singularities
• A generalization of tight closure and multiplier ideals
• An interpretation of multiplier ideals via tight closure
• Strong and weak F -regularity are equivalent for graded rings
• A subadditivity property of multiplier ideals.
• Behavior of test ideals under smooth and étale homomorphisms.