Stability monitoring of batch processes with iterative learning control

DOI10.1155/2017/5912651zbMATH Open1401.93160OpenAlexW2584755352WikidataQ59142452 ScholiaQ59142452MaRDI QIDQ1798445FDOQ1798445

Authors: Yan Wang, Junwei Sun, Lexiang Wang, Tai-Shan Lou 

Publication date: 23 October 2018

Published in: Advances in Mathematical Physics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1155/2017/5912651

Recommendations

• Iterative learning control of batch processes based on time varying perturbation models
• A synthetic approach for robust constrained iterative learning control of piecewise affine batch processes
• Extended state observer based indirect-type ILC for single-input single-output batch processes with time- and batch-varying uncertainties
• Iterative learning stabilization and fault-tolerant control for batch processes
• Robust design of iterative learning control for a batch process described by 2D Roesser system with packet dropouts and time-varying delays

zbMATH Keywords

iterative learning controlbatch processesstability monitoring

Mathematics Subject Classification ID

Lyapunov and other classical stabilities (Lagrange, Poisson, (L^p, l^p), etc.) in control theory (93D05) Control/observation systems involving computers (process control, etc.) (93C83)

Cites Work

• The Adaptive Lasso and Its Oracle Properties
• Stability tests for 2-D systems using the Schwarz form and the inners determinants
• Two-dimensional autoregressive (2D AR) model order estimation.
• Title not available (Why is that?)

Cited In (8)

• Embedding active learning in batch-to-batch optimization using reinforcement learning
• Iterative learning stabilization and fault-tolerant control for batch processes
• A local dynamic extreme learning machine based iterative learning control of nonlinear batch process
• Iterative learning control of batch processes based on time varying perturbation models
• Batch process control-overview and outlook
• Adaptive iterative extended state observer-based data-driven iterative learning model predictive control for semiconductor silicon single crystal batch process
• Title not available (Why is that?)
• Optimal iterative learning control of batch processes: from model-based to data-driven

This page was built for publication: Stability monitoring of batch processes with iterative learning control

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q1798445)