A Singular Perturbation Analysis of the Fundamental Semiconductor Device Equations
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Publication:3684483
DOI10.1137/0144064zbMath0568.35007MaRDI QIDQ3684483
Publication date: 1984
Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1137/0144064
existence; a priori estimates; weak solutions; matched asymptotic expansions; asymptotic behaviour; numerical simulation; singular perturbation analysis; Neumann-Dirichlet boundary conditions; fundamental semiconductor device equations
35J65: Nonlinear boundary value problems for linear elliptic equations
35B25: Singular perturbations in context of PDEs
35C20: Asymptotic expansions of solutions to PDEs
78A30: Electro- and magnetostatics
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