Quasi-neutral limit to the drift-diffusion models for semiconductors with physical contact-insulating boundary conditions and the general sign-changing doping profile
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Cites work
- scientific article; zbMATH DE number 3150729 (Why is no real title available?)
- scientific article; zbMATH DE number 108361 (Why is no real title available?)
- A Singular Perturbation Analysis of the Fundamental Semiconductor Device Equations
- A Singularly Perturbed Boundary Value Problem Modelling a Semiconductor Device
- An Asymptotic Analysis of One-Dimensional Models of Semiconductor Devices
- On Existence, Uniqueness and Asymptotic Behavior of Solutions of the Basic Equations for Carrier Transport in Semiconductors
- On Maxwellian equilibria of insulated semiconductors
- On singular limits of mean-field equations.
- QUASINEUTRAL LIMIT OF THE DRIFT-DIFFUSION MODEL FOR SEMICONDUCTORS WITH GENERAL INITIAL DATA
- QUASINEUTRAL LIMIT OF THE MULTI-DIMENSIONAL DRIFT-DIFFUSION-POISSON MODELS FOR SEMICONDUCTORS WITH PN-JUNCTIONS
- Quasi-neutral Limit of the Drift Diffusion Models for Semiconductors: The Case of General Sign-Changing Doping Profile
- Quasi-neutral limit of a nonlinear drift diffusion model for semiconductors
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- Quasineutral Limit of Euler–Poisson System with and without Viscosity
- Quasineutral limit of a time-dependent drift-diffusion-Poisson model for p-n junction semiconductor devices
- The initial time layer problem and the quasineutral limit in the semiconductor drift-diffusion model
Cited in
(3)- Quasi-neutral limit of the drift-diffusion model for semiconductors with general sign-changing doping profile
- Quasi-neutral limit to the drift-diffusion models for semiconductors with physical contact-insulating boundary conditions
- Mixed layer problem and quasineutral limit of the bipolar drift-diffusion model with different mobilities
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