A QUALITATIVE ANALYSIS OF THE FUNDAMENTAL SEMICONDUCTOR DEVICE EQUATIONS
DOI10.1108/EB009978zbMATH Open0619.65115OpenAlexW2058724619MaRDI QIDQ3756462FDOQ3756462
Publication date: 1983
Published in: COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1108/eb009978
boundary layerselliptic systemsscalingmatched asymptotic expansionsPoisson's equationsingular perturbation theoryfundamental static semiconductor device equationsnormed minimal Debye lengthoxide- semiconductor interfacesSchottky contacts
Singular perturbations in context of PDEs (35B25) Partial differential equations of mathematical physics and other areas of application (35Q99) Motion of charged particles (78A35) Applications to the sciences (65Z05)
Cites Work
Cited In (9)
- Title not available (Why is that?)
- A Singular Perturbation Analysis of the Fundamental Semiconductor Device Equations
- A SENSITIVITY ANALYSIS OF THE STEADY STATE SEMICONDUCTOR DEVICE EQUATIONS
- Title not available (Why is that?)
- Title not available (Why is that?)
- Title not available (Why is that?)
- A MASS‐LUMPING SEMIDISCRETIZATION OF THE SEMICONDUCTOR DEVICE EQUATIONS
- An analysis of the Scharfetter-Gummel box method for the stationary semiconductor device equations
- Semiconductor device modelling from the numerical point of view
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