Iddq testing-based diagnosis of faults in CMOS-circuits

zbMATH Open1274.94165MaRDI QIDQ378377FDOQ378377

Authors: Yu. V. Bykov, A. A. Ivanyuk, A. I. Yanushkevich, Vyacheslav Yarmolik 

Publication date: 11 November 2013

Published in: Automation and Remote Control (Search for Journal in Brave)

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Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cited In (5)

• Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models
• IDDQ testing technology for one-dimensional iterative logic arrays
• Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells
• Infrastructure intellectual property for SoC simulation and diagnosis service
• Title not available (Why is that?)

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