Advances in Neural Networks – ISNN 2005

DOI10.1007/B136479zbMATH Open1084.68651OpenAlexW4292906701MaRDI QIDQ5707441FDOQ5707441

Authors: Tae Seon Kim 

Publication date: 23 November 2005

Published in: Lecture Notes in Computer Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/b136479

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Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Neural networks for/in biological studies, artificial life and related topics (92B20) Application models in control theory (93C95)

Cited In (6)

• Error classification and yield prediction of chips in semiconductor industry applications.
• Validation and evaluation for defect-kill-rate and yield estimation models in semiconductor manufacturing
• A Hybrid and Intelligent System for Predicting Lot Output Time in a Semiconductor Fabrication Factory
• Combining SOM and GA-CBR for Flow Time Prediction in Semiconductor Manufacturing Factory
• Multi-step virtual metrology for semiconductor manufacturing: a multilevel and regularization methods-based approach
• A novel quality prediction method based on feature selection considering high dimensional product quality data

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