The following pages link to Hideo Fujiwara (Q673012):
Displaying 24 items.
- An optimal parallel algorithm for the Euclidean distance maps of 2-D binary images (Q673013) (← links)
- A latency optimal superstabilizing mutual exclusion protocol in unidirectional rings (Q701145) (← links)
- (Q1101082) (redirect page) (← links)
- A testable design of programmable logic arrays with universal control and minimal overhead (Q1101084) (← links)
- A cost optimal parallel algorithm for weighted distance transforms. (Q1606863) (← links)
- Multicast-Based Testing and Thermal-Aware Test Scheduling for 3D ICs with a Stacked Network-on-Chip (Q2985288) (← links)
- An Easily Testable Design of Programmable Logic Arrays for Multiple Faults (Q3041100) (← links)
- A New Built-In Self-Test Design for PLA's with Hligh Fault Coverage and Low Overhead (Q3767267) (← links)
- On Closedness and Test Complexity of Logic Circuits (Q3912732) (← links)
- A design of programmable logic arrays with universal tests (Q3912733) (← links)
- A Design of Programmable Logic Arrays with Universal Tests (Q3921158) (← links)
- The Complexity of Fault Detection Problems for Combinational Logic Circuits (Q3944512) (← links)
- Easily Testable Sequential Machines with Extra Inputs (Q4074823) (← links)
- Connection Assignments for Probabilistically Diagnosable Systems (Q4149673) (← links)
- Some Existence Theorems for Probabilistically Diagnosable Systems (Q4163140) (← links)
- On the Computational Complexity of System Diagnosis (Q4167582) (← links)
- An approach to test synthesis from higher level (Q4225366) (← links)
- (Q4250795) (← links)
- (Q4436046) (← links)
- Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction (Q4564142) (← links)
- Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST (Q4564254) (← links)
- A new class of sequential circuits with combinational test generation complexity (Q4571371) (← links)
- Design of Diagnosable Sequential Machines Utilizing Extra Outputs (Q4775803) (← links)
- Computational complexity of controllability/observability problems for combinational circuits (Q5375445) (← links)
