Pages that link to "Item:Q949220"
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The following pages link to Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs (Q949220):
Displaying 15 items.
- A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length (Q355292) (← links)
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\) (Q891140) (← links)
- Lower bounds for the lengths of single tests for Boolean circuits (Q1741479) (← links)
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder (Q2096002) (← links)
- The length of single fault detection tests with respect to substitution of gates with inverters (Q2096004) (← links)
- The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases (Q2135320) (← links)
- Minimal complete fault detection tests for circuits of functional elements in standard basis (Q2287393) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements (Q2356509) (← links)
- Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements (Q3057821) (← links)
- Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates (Q4558289) (← links)
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two (Q4973245) (← links)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits (Q5374004) (← links)
