Testing asynchronous circuits: A survey

DOI10.1016/0167-9260(95)00012-5MaRDI QIDQ3122506zbMATH OpenOpenAlexFDO

Authors Henrik Hulgaard, Steven M. Burns, Gaetano Borriello

Publication date 27 February 1997

Published in Integration (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0167-9260(95)00012-5

zbMATH Keywords

Asynchronous circuitsPath delay fault testingSelf-checking circuitsStuck-at fault testingTest generation

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cited in

(4)

• Simulating asynchronous hardware on multiprocessor platforms: The case of AMULET1
• Robust asynchronous implementation of Boolean functions on the basis of duality
• On the role of hardware reset in synchronous sequential circuit test generation
• scientific article; zbMATH DE number 1979558 (Why is no real title available?)

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