Bayesian Analysis of Masked Series System Lifetime Data

DOI10.1080/03610920600853357zbMath1109.62092OpenAlexW2066108570MaRDI QIDQ3435984

Sanjib Basu, Chiranjit Mukhopadhyay

Publication date: 8 May 2007

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610920600853357

zbMATH Keywords

reliabilitycensoringDirichlet distributionGibbs samplingcompeting riskslog-normal distributionnormal-gamma priormasking probabilities

Mathematics Subject Classification ID

Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)

Related Items

A consistent NPMLE of the joint distribution function with competing risks data under the dependent masking and right-censoring model ⋮ The random partition masking model for interval-censored and masked competing risks data ⋮ Random partition masking model for censored and masked competing risks data ⋮ Analysis of masked data with Lindley failure model ⋮ Inference based on progressive Type I interval censored data from log-normal distribution ⋮ Consistency of the Generalized MLE with Interval-Censored and Masked Competing Risks Data ⋮ About conditional masking probability models ⋮ Bayesian accelerated life testing under competing log-location-scale family of causes of failure ⋮ Identifiability of masking probabilities in competing risks models with emphasis on Weibull models ⋮ Bayesian Analysis of a Superimposed Renewal Process ⋮ Inference About the Masking Probabilities in the Competing Risks Model ⋮ THE NPMLE of the joint distribution function with right-censored and masked competing risks data

Cites Work

• Unnamed Item
• Statistical decision theory and Bayesian analysis. 2nd ed
• Estimating system and component reliabilities under partial information on cause of failure
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Bayesian analysis of incomplete time and cause of failure data
• Parametric modeling for survival with competing risks and masked failure causes
• Dependent masking and system life data analysis: Bayesian inference for two-component systems
• Bayesian reliability modeling for masked system lifetime data
• Maximum likelihood analysis of masked series system lifetime data
• Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
• Nonparametric Prevalence and Mortality Estimators for Animal Experiments With Incomplete Cause-of-Death Data
• Survival with competing risks and masked causes of failures
• Bayesian Analysis for the Poly-Weibull Distribution
• Inference about Defects in the Presence of Masking
• Bayesian Inference for Masked System Lifetime Data