Optimum attributes component test plans for k-out-of-n:F Weibull systems using prior information
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Publication:300038
DOI10.1016/J.EJOR.2014.08.027zbMATH Open1341.62290OpenAlexW2076812642MaRDI QIDQ300038FDOQ300038
Publication date: 23 June 2016
Published in: European Journal of Operational Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ejor.2014.08.027
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quality controlaverage operating characteristic functionsconstrained optimisationindustrial reliabilityinteger nonlinear programming
Reliability and life testing (62N05) Testing in survival analysis and censored data (62N03) Reliability, availability, maintenance, inspection in operations research (90B25)
Cites Work
- Reliability analysis of a single warm-standby system subject to repairable and nonrepairable failures
- Order Statistics
- Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
- Bayesian estimation based on trimmed samples from Pareto populations
- Design of accelerated life test sampling plans with a nonconstant shape parameter
- Accuracy of approximate progressively censored reliability sampling plans for exponential models
- Reliability inference and sample-size determination under double censoring for some two-parameter models
- Optimum component test plans for systems with dependent components
- Bayesian variable selection in generalized linear models using a combination of stochastic optimization methods
- Reliability and covariance estimation of weighted \(k\)-out-of-\(n\) multi-state systems
- Computing tolerance limits for the lifetime of a \(k\)-out-of-\(n\):\(F\) system based on prior information and censored data
- Imperfect debugging in software reliability: a Bayesian approach
- Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis
- A semiparametric Bayesian approach to the analysis of financial time series with applications to value at risk estimation
- Cold vs. hot standby mission operation cost minimization for 1-out-of-\(N\) systems
- A new approach to assess product lifetime performance for small data sets
- One- and two-sample prediction based on doubly censored exponential data and prior informa\-tion
- Two-sided tolerance intervals in the exponential case: corrigenda and generalizations
- Optimum component test plans for phased-mission systems
- Recursive algorithm for the reliability of a connected-(1,2)-or-(2,1)-out-of-\((m, n)\):F lattice system
- Reliability tests for Weibull distribution with variational shape parameter based on sudden death lifetime data
- Call center service process analysis: Bayesian parametric and semi-parametric mixture modeling
- Bayesian optimal knapsack procurement
- Maximizing system availability through joint decision on component redundancy and spares inventory
- Progressively censored variables sampling plans for two-parameter exponential distributions
- A Component-Testing Procedure For A Parallel System With Type II Censoring
- A type-II censored, log test time based, component-testing procedure for a parallel system
- An Optimum Component Testing Procedure for a Series System with Redundant Subsystems
- System-Based Component-Test Plans and Operating Characteristics: Binomial Data
- Optimal Test Design for Reliability Demonstration
- An Optimum Procedure for Component Testing in the Demonstration of Series System Reliability
- Design of progressively censored group sampling plans for Weibull distributions: an optimization problem
- Generalized beta prior models on fraction defective in reliability test planning
- Optimal acceptance sampling plans for log-location-scale lifetime models using average risks
- Minimum cost component test plans for evaluating reliability of a highly reliable parallel system
- Combined \(m\)-consecutive and \(k\)-out-of-\(n\) sliding window systems
- A Comparison of Several Component-Testing Plans for a Series System
- Designing Component Test Plans for Series System Reliability via Mathematical Programming
- Discrete random bounds for general random variables and applications to reliability
- Bayesian single and double variable sampling plans for the Weibull distribution with censoring
- Bounding maximum likelihood estimates based on incomplete ordered data
Cited In (7)
- Optimal lot sentencing based on defective counts and prior acceptability
- Economic lot sampling inspection from defect counts with minimum conditional value-at-risk
- Efficient truncated repetitive lot inspection using Poisson defect counts and prior information
- Optimal truncated repetitive lot inspection with defect rates
- Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks
- Connectivity modeling and optimization of linear consecutively connected systems with repairable connecting elements
- Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design
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