Optimum attributes component test plans for k-out-of-n:F Weibull systems using prior information
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Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information
Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information
Recommendations
- The design of optimum component test plans in the demonstration of a series system reliability
- The design of optimum component test plans in the demonstration of system reliability
- The design of optimum component test plans for system reliability
- Designing Component Test Plans for Series System Reliability via Mathematical Programming
- A Comparison of Several Component-Testing Plans for a Series System
Cites work
- A Comparison of Several Component-Testing Plans for a Series System
- A Component-Testing Procedure For A Parallel System With Type II Censoring
- A new approach to assess product lifetime performance for small data sets
- A semiparametric Bayesian approach to the analysis of financial time series with applications to value at risk estimation
- A type-II censored, log test time based, component-testing procedure for a parallel system
- Accuracy of approximate progressively censored reliability sampling plans for exponential models
- An Optimum Component Testing Procedure for a Series System with Redundant Subsystems
- An Optimum Procedure for Component Testing in the Demonstration of Series System Reliability
- Bayesian estimation based on trimmed samples from Pareto populations
- Bayesian optimal knapsack procurement
- Bayesian single and double variable sampling plans for the Weibull distribution with censoring
- Bayesian variable selection in generalized linear models using a combination of stochastic optimization methods
- Bounding maximum likelihood estimates based on incomplete ordered data
- Call center service process analysis: Bayesian parametric and semi-parametric mixture modeling
- Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis
- Cold vs. hot standby mission operation cost minimization for 1-out-of-\(N\) systems
- Combined \(m\)-consecutive and \(k\)-out-of-\(n\) sliding window systems
- Computing tolerance limits for the lifetime of a \(k\)-out-of-\(n\):\(F\) system based on prior information and censored data
- Design of accelerated life test sampling plans with a nonconstant shape parameter
- Design of progressively censored group sampling plans for Weibull distributions: an optimization problem
- Designing Component Test Plans for Series System Reliability via Mathematical Programming
- Discrete random bounds for general random variables and applications to reliability
- Generalized beta prior models on fraction defective in reliability test planning
- Imperfect debugging in software reliability: a Bayesian approach
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- Minimum cost component test plans for evaluating reliability of a highly reliable parallel system
- One- and two-sample prediction based on doubly censored exponential data and prior informa\-tion
- Optimal Test Design for Reliability Demonstration
- Optimal acceptance sampling plans for log-location-scale lifetime models using average risks
- Optimum component test plans for phased-mission systems
- Optimum component test plans for systems with dependent components
- Order Statistics
- Progressively censored variables sampling plans for two-parameter exponential distributions
- Recursive algorithm for the reliability of a connected-(1,2)-or-(2,1)-out-of-\((m, n)\):F lattice system
- Reliability analysis of a single warm-standby system subject to repairable and nonrepairable failures
- Reliability and covariance estimation of weighted \(k\)-out-of-\(n\) multi-state systems
- Reliability inference and sample-size determination under double censoring for some two-parameter models
- Reliability tests for Weibull distribution with variational shape parameter based on sudden death lifetime data
- System-Based Component-Test Plans and Operating Characteristics: Binomial Data
- Two-sided tolerance intervals in the exponential case: corrigenda and generalizations
- Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
Cited in
(7)- Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design
- Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks
- Efficient truncated repetitive lot inspection using Poisson defect counts and prior information
- Connectivity modeling and optimization of linear consecutively connected systems with repairable connecting elements
- Optimal lot sentencing based on defective counts and prior acceptability
- Optimal truncated repetitive lot inspection with defect rates
- Economic lot sampling inspection from defect counts with minimum conditional value-at-risk
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