Inverse-Average-Type Finite Element Discretizations of Selfadjoint Second-Order Elliptic Problems
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Publication:3477918
DOI10.2307/2008757zbMath0699.65074OpenAlexW4247285568MaRDI QIDQ3477918
Peter A. Markovich, Miloš Zlámal
Publication date: 1988
Full work available at URL: https://doi.org/10.2307/2008757
finite element methodsstiffness matrixsemiconductor device simulationdiagonally dominant Stieltjes matrixinverse-average-type approximationspiecewise linear interpolantselfadjoint second-order elliptic boundary value problems
Boundary value problems for second-order elliptic equations (35J25) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Technical applications of optics and electromagnetic theory (78A55)
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Cites Work
- Generalized Finite Element Methods: Their Performance and Their Relation to Mixed Methods
- Finite Element Solution of the Fundamental Equations of Semiconductor Devices. I
- ANALYSIS OF A DISCRETIZATION ALGORITHM FOR STATIONARY EQUATIONS IN SEMICONDUCTOR DEVICE MODELS, III
- Uniform Asymptotic Representation of Solutions of the Basic Semiconductor-Device Equations
- Theory of the Flow of Electrons and Holes in Germanium and Other Semiconductors
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