Robust control and data‐driven tuning of a hybrid integrator‐gain system with applications to wafer scanners

From MaRDI portal
Publication:5222723


DOI10.1002/acs.2888zbMath1417.93121MaRDI QIDQ5222723

Daniel Andreas Deenen, M. F. Heertjes, N. Irigoyen Perdiguero

Publication date: 10 July 2019

Published in: International Journal of Adaptive Control and Signal Processing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/acs.2888


93B35: Sensitivity (robustness)

93C20: Control/observation systems governed by partial differential equations

93C95: Application models in control theory

93C80: Frequency-response methods in control theory

93D09: Robust stability


Related Items



Cites Work