Design framework for high-performance optimal sampled-data control with application to a wafer stage
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Publication:5758317
DOI10.1080/00207170701216329zbMath1124.93017OpenAlexW2114450850MaRDI QIDQ5758317
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Publication date: 3 September 2007
Published in: International Journal of Control (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00207170701216329
System identification (93B30) Eigenvalue problems (93B60) Sampled-data control/observation systems (93C57)
Related Items (8)
On interval tracking performance evaluation and practical varying sampling ILC ⋮ System identification for achieving robust performance ⋮ Comparing multivariable uncertain model structures for data‐driven robust control: Visualization and application to a continuously variable transmission ⋮ Optimally conditioned instrumental variable approach for frequency-domain system identification ⋮ Beyond equidistant sampling for performance and cost: A loop‐shaping approach applied to a motion system ⋮ Intersample optimization in a sampled-data control system using the redundancy of a dual-rate system ⋮ Suppressing intersample behavior in iterative learning control ⋮ Controlling aliased dynamics in motion systems? An identification for sampled-data control approach
Uses Software
Cites Work
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