On inverse problems for semiconductor equations

DOI10.1007/S00032-004-0025-6zbMATH Open1214.82122arXiv2011.11370OpenAlexW2089530284MaRDI QIDQ879738FDOQ879738

Authors: Martin Burger, Heinz W. Engl, A. Leitão, Peter Alexander Markowich 

Publication date: 9 May 2007

Published in: Milan Journal of Mathematics (Search for Journal in Brave)

Abstract: This paper is devoted to the investigation of inverse problems related to stationary drift-diffusion equations modeling semiconductor devices. In this context we analyze several identification problems corresponding to different types of measurements, where the parameter to be reconstructed is an inhomogeneity in the PDE model (doping profile). For a particular type of measurement (related to the voltage-current map) we consider special cases of drift-diffusion equations, where the inverse problems reduces to a classical inverse conductivity problem. A numerical experiment is presented for one of these special situations (linearized unipolar case).

Full work available at URL: https://arxiv.org/abs/2011.11370

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zbMATH Keywords

inverse problemssemiconductor devicesstationary drift-diffusion equations

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Ionized gas flow in electromagnetic fields; plasmic flow (76X05) Statistical mechanics of semiconductors (82D37)

Cited In (13)

• On a family of gradient-type projection methods for nonlinear ill-posed problems
• The method of integral equations in the oblique derivative problem arising in semiconductor physics
• Modeling and simulation of the lateral photovoltage scanning method
• Identification of doping profiles in semiconductor devices
• On steepest-descent-Kaczmarz methods for regularizing systems of nonlinear ill-posed equations
• A complete analysis of a classical Poisson-Nernst-Planck model for ionic flow
• On inverse doping profile problems for the stationary voltage–current map
• One-dimensional steady-state Poisson-Nernst-Planck systems for ion channels with multiple ion species
• Reconstruction of the doping profile in Vlasov-Poisson system
• Inverse problems for semiconductors: models and methods
• On projective Landweber-Kaczmarz methods for solving systems of nonlinear ill-posed equations
• An inverse problem of charge-collection microscopy
• Identification of semiconductor contact resistivity

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