Electrostatic coupling of MEMS structures: Transient simulations and dynamic pull-in
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Publication:999955
DOI10.1016/J.NA.2005.01.055zbMATH Open1224.78044OpenAlexW2022370408MaRDI QIDQ999955FDOQ999955
Daniel Rixen, V. Rochus, J.-C. Golinval
Publication date: 4 February 2009
Published in: Nonlinear Analysis. Theory, Methods \& Applications. Series A: Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.na.2005.01.055
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- Coupled mechanical‐electrostatic FE‐BE analysis with FMM acceleration
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- Effect of geometrical nonlinearity on MEMS thermoelastic damping
- Effect of geometric nonlinearity on dynamic pull-in behavior of coupled-domain microstructures based on classical and shear deformation plate theories
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