Efficient algorithm based on two-grid method for semiconductor device problem

DOI10.1016/J.CAMWA.2023.05.030MaRDI QIDQ6135135zbMATH OpenFDO

Authors Ying Liu, Yanping Chen, Yunqing Huang

Publication date 23 August 2023

Published in Computers & Mathematics with Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/J.CAMWA.2023.05.030

zbMATH Keywords

finite element methodmixed finite element methodsemiconductor device\( L^q\) error estimatesthree-step two-grid algorithm

Mathematics Subject Classification ID

Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs (65M12) Error bounds for initial value and initial-boundary value problems involving PDEs (65M15) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Finite element methods applied to problems in fluid mechanics (76M10)

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Cited in

(3)

• Analysis of a two-grid method for semiconductor device problem
• Two-grid mixed finite element analysis of semi-linear second order hyperbolic problem
• Upwind block-centered multistep differences for semiconductor device problem with heat and magnetic influences

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