On the length of diagnostic tests for Boolean circuits
From MaRDI portal
Recommendations
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- Short complete diagnostic tests for logic circuits in one infinite basis
- Short complete diagnostic tests for circuits with one additional input in the standard basis
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
Cites work
Cited in
(35)- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Tests with stuck-at and shift faults on circuit inputs
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
- On self-correcting logic circuits of unreliable gates with at most two inputs
- Estimations of the lengths of tests for logic gates in presence of many permissible faults
- scientific article; zbMATH DE number 808802 (Why is no real title available?)
- Lower bounds for the lengths of single tests for Boolean circuits
- Diagnostic tests for local coalescences of variables in Boolean functions
- On unit diagnostic tests for constant faults of the same type at outputs of functional elements
- On diagnostic test sets for local mirror reflections on circuit inputs
- scientific article; zbMATH DE number 3885799 (Why is no real title available?)
- Short complete diagnostic tests for circuits with one additional input in the standard basis
- Fault detection and diagnostic tests for logic gates
- Identity checking tests for circuits of functional elements in fan-in 2 bases
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- Check and diagnostic tests for AND, OR, and NOT gates
- scientific article; zbMATH DE number 4106777 (Why is no real title available?)
- Recognizing the nonrepeating property in an arbitrary basis
- Short complete diagnostic tests for circuits with two additional inputs in some basis
- Short complete diagnostic tests for logic circuits in one infinite basis
- Estimates for lengths of check and diagnostic tests of functional elements
- scientific article; zbMATH DE number 3693155 (Why is no real title available?)
- On the number of minimal tests checking the block circuits of parity functions for closings
- Diagnostics of inverse errors on inputs of disjunction scheme elements
- scientific article; zbMATH DE number 3924684 (Why is no real title available?)
- Complete tests relative to displacing faults of inputs of circuits
- Diagnosis of constant faults in iteration-free circuits over monotone basis
- Diagnostic tests for discrete functions defined on rings
- Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates
- On effective methods for diagnosis of retaining faults in circuits
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
- Circuits for disjunction admitting short unitary diagnostic tests
- Minimal complete fault detection tests for circuits of functional elements in standard basis
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
- Short conditional complete diagnostic tests for circuits under one-type constant faults of gates
This page was built for publication: On the length of diagnostic tests for Boolean circuits
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q679884)
