scientific article

zbMath1358.94118MaRDI QIDQ2968777

Nikolay P. Red'kin

Publication date: 21 March 2017

Title: zbMATH Open Web Interface contents unavailable due to conflicting licenses.

Mathematics Subject Classification ID

Related Items (50)

Tests for multiple linear conglutinations of variables in Boolean functions ⋮ Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs ⋮ The length of a single fault detection test for constant-nonpreserving element insertions ⋮ The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases ⋮ Estimations of the lengths of tests for logic gates in presence of many permissible faults ⋮ Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates ⋮ Tests of contact closure for contact circuits ⋮ Short single fault detection tests for logic networks under arbitrary faults of gates ⋮ Short complete diagnostic tests for circuits with one additional input in the standard basis ⋮ Single fault detection tests for generalized iterative switching circuits ⋮ Tests for multiple monotone symmetric conglutinations of variables in Boolean functions ⋮ Lower estimate of the length of the complete test in the basis \(\{x|y \}\) ⋮ Short complete diagnostic tests for circuits with two additional inputs in some basis ⋮ On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits ⋮ Short tests of closures for contact circuits ⋮ On implementation of Boolean functions by contact circuits of minimal uniform width ⋮ Short complete diagnostic tests for logic circuits in one infinite basis ⋮ Some classes of easily testable circuits in the Zhegalkin basis ⋮ Shannon function of the test length with respect to gate input identification ⋮ Short complete diagnostic tests for circuits implementing linear Boolean functions ⋮ Minimal contact circuits for symmetric threshold functions ⋮ On the exact value of the length of the minimal single diagnostic test for a particular class of circuits ⋮ LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS ⋮ SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES ⋮ Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates ⋮ ABOUT RELIABILITY OF CIRCUITS IN THE BASIS CONSISTING OF THE WEBB FUNCTION IN Pk UNDER FAILURES OF 0 TYPE AND k − 1 TYPE AT THE OUTPUTS OF ELEMENTS ⋮ A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS ⋮ On fault detection tests of contact break for contact circuits ⋮ Lower bounds for the lengths of single tests for Boolean circuits ⋮ A method of synthesis of irredundant circuits admitting single fault detection tests of constant length ⋮ On the length of diagnostic tests for Boolean circuits ⋮ On implementation of Boolean functions by contact circuits with a constant uniform width ⋮ Synthesis of reliable circuits in the basis consisting of the Webb function in \(P_4\) and \(P_5\) ⋮ The conjunction complexity asymptotic of self-correcting circuits for monotone symmetric functions with threshold 2 ⋮ Synthesis of reliable circuits in the basis consisting of the Webb function in \(P_k\) ⋮ Minimal complete fault detection tests for circuits of functional elements in standard basis ⋮ Unit checking output tests under constant faults for functional elements ⋮ Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates ⋮ Minimal contact circuits for a sequence of Boolean functions ⋮ Bounds on Shannon functions of lengths of contact closure tests for contact circuits ⋮ Short Complete Fault Detection Tests for Logic Networks with Fan-In Two ⋮ Diagnostic tests for contact circuits ⋮ On diagnostic tests of contact break for contact circuits ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates ⋮ The length of single fault detection tests with respect to substitution of gates with inverters ⋮ On self-correcting logic circuits of unreliable gates with at most two inputs ⋮ Upper bound of unreliability of circuits in a basis consisting of Webb functions ⋮ Check and diagnostic tests for AND, OR, and NOT gates ⋮ Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements ⋮ On tests detecting certain faults of circuit inputs for almost all Boolean functions

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